New Techniques for Deterministic Test Pattern Generation

This paper presents new techniques for speeding up deterministic test pattern generation for VLSI circuits. These techniques improve the PODEM algorithm by reducing number of back-tracks with a low computational cost. This is achieved by nding more necessary signal line assignments, by detecting connicts earlier, and by avoiding unnecessary work during test generation. We have incorporated these techniques into an advanced ATPG system for combinational circuits, called ATOM. The performance results for the ISCAS85 and full scan version of the ISCAS89 benchmark circuits demonstrated the eeectiveness of these techniques on the test generation performance. ATOM detected all the testable faults and proved all the redundant faults to be redundant with a small number of backtracks in a short amount of time.